%0 Conference Paper %1 conf/dac/TengCRK96 %A Teng, Chin-Chi %A Cheng, Yi-Kan %A Rosenbaum, Elyse %A Kang, Sung-Mo %B DAC %D 1996 %E Pennino, Thomas %E Yoffa, Ellen J. %I ACM Press %K dblp %P 752-757 %T Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects. %U http://dblp.uni-trier.de/db/conf/dac/dac96.html#TengCRK96 %@ 0-89791-779-0

@inproceedings{conf/dac/TengCRK96, added-at = {2017-03-16T00:00:00.000+0100}, author = {Teng, Chin-Chi and Cheng, Yi-Kan and Rosenbaum, Elyse and Kang, Sung-Mo}, biburl = {https://www.bibsonomy.org/bibtex/236cd2de690d1206055cf39e34abaf439/dblp}, booktitle = {DAC}, crossref = {conf/dac/1996}, editor = {Pennino, Thomas and Yoffa, Ellen J.}, ee = {http://doi.acm.org/10.1145/240518.240661}, interhash = {c35e3dbb85281b64983322cdd6e7d635}, intrahash = {36cd2de690d1206055cf39e34abaf439}, isbn = {0-89791-779-0}, keywords = {dblp}, pages = {752-757}, publisher = {ACM Press}, timestamp = {2017-03-17T11:39:35.000+0100}, title = {Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac96.html#TengCRK96}, year = 1996 }