%0 Journal Article %1 journals/tcas/IslamPK18 %A Islam, Md. Nazmul %A Patil, Vinay C. %A Kundu, Sandip %D 2018 %J IEEE Trans. Circuits Syst. I Regul. Pap. %K dblp %N 3 %P 960-969 %T On Enhancing Reliability of Weak PUFs via Intelligent Post-Silicon Accelerated Aging. %U http://dblp.uni-trier.de/db/journals/tcas/tcasI65.html#IslamPK18 %V 65-I

@article{journals/tcas/IslamPK18, added-at = {2020-05-22T00:00:00.000+0200}, author = {Islam, Md. Nazmul and Patil, Vinay C. and Kundu, Sandip}, biburl = {https://www.bibsonomy.org/bibtex/2a0216028fae627cdbcce8d59644b7e82/dblp}, ee = {https://doi.org/10.1109/TCSI.2017.2766073}, interhash = {c3c6f677c42a8c23988212817c87197a}, intrahash = {a0216028fae627cdbcce8d59644b7e82}, journal = {IEEE Trans. Circuits Syst. I Regul. Pap.}, keywords = {dblp}, number = 3, pages = {960-969}, timestamp = {2020-05-23T12:31:52.000+0200}, title = {On Enhancing Reliability of Weak PUFs via Intelligent Post-Silicon Accelerated Aging.}, url = {http://dblp.uni-trier.de/db/journals/tcas/tcasI65.html#IslamPK18}, volume = {65-I}, year = 2018 }