%0 Conference Paper %1 conf/icra/ShimCK96 %A Shim, J. H. %A Cho, Hyung Suck %A Kim, S. %B ICRA %D 1996 %I IEEE %K dblp %P 590-595 %T A new probing system for the in-circuit test of a PCB. %U http://dblp.uni-trier.de/db/conf/icra/icra1996.html#ShimCK96 %@ 0-7803-2988-0

@inproceedings{conf/icra/ShimCK96, added-at = {2017-05-22T00:00:00.000+0200}, author = {Shim, J. H. and Cho, Hyung Suck and Kim, S.}, biburl = {https://www.bibsonomy.org/bibtex/22fb2c71c949408cf1222c2bc61845644/dblp}, booktitle = {ICRA}, crossref = {conf/icra/1996}, ee = {https://doi.org/10.1109/ROBOT.1996.503839}, interhash = {c78d11af4494ab673dd709438229ef07}, intrahash = {2fb2c71c949408cf1222c2bc61845644}, isbn = {0-7803-2988-0}, keywords = {dblp}, pages = {590-595}, publisher = {IEEE}, timestamp = {2024-04-09T10:29:32.000+0200}, title = {A new probing system for the in-circuit test of a PCB.}, url = {http://dblp.uni-trier.de/db/conf/icra/icra1996.html#ShimCK96}, year = 1996 }