%0 Conference Paper %1 conf/det/LiuLY09 %A Liu, Yimeng %A Li, Yihua %A Yao, Jin %B DET %D 2009 %E Huang, George Q. %E Mak, Kai-Ling %E Maropoulos, Paul G. %I Springer %K dblp %P 757-771 %T Achieving Semiconductor Assembly and Test Manufacturing Excellence via Manufacturing Execution System. %U http://dblp.uni-trier.de/db/conf/det/det2009.html#LiuLY09 %V 66 %@ 978-3-642-10429-9

@inproceedings{conf/det/LiuLY09, added-at = {2017-05-19T00:00:00.000+0200}, author = {Liu, Yimeng and Li, Yihua and Yao, Jin}, biburl = {https://www.bibsonomy.org/bibtex/2fef4c9746ea31174d986caeadbc8a873/dblp}, booktitle = {DET}, crossref = {conf/det/2009}, editor = {Huang, George Q. and Mak, Kai-Ling and Maropoulos, Paul G.}, ee = {https://doi.org/10.1007/978-3-642-10430-5_59}, interhash = {c803201be007e3ec28f9e49f0a116387}, intrahash = {fef4c9746ea31174d986caeadbc8a873}, isbn = {978-3-642-10429-9}, keywords = {dblp}, pages = {757-771}, publisher = {Springer}, series = {Advances in Intelligent and Soft Computing}, timestamp = {2018-11-15T16:03:16.000+0100}, title = {Achieving Semiconductor Assembly and Test Manufacturing Excellence via Manufacturing Execution System.}, url = {http://dblp.uni-trier.de/db/conf/det/det2009.html#LiuLY09}, volume = 66, year = 2009 }