%0 Journal Article %1 journals/ieicet/KimKKK08 %A Kim, Youbean %A Kim, Kicheol %A Kim, Incheol %A Kang, Sungho %D 2008 %J IEICE Trans. Electron. %K dblp %N 10 %P 1713-1716 %T A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet91c.html#KimKKK08 %V 91-C

@article{journals/ieicet/KimKKK08, added-at = {2020-04-11T00:00:00.000+0200}, author = {Kim, Youbean and Kim, Kicheol and Kim, Incheol and Kang, Sungho}, biburl = {https://www.bibsonomy.org/bibtex/26c473593fb96c55688702d76fd4039b3/dblp}, ee = {https://doi.org/10.1093/ietele/e91-c.10.1713}, interhash = {c80c48ea90d47a097c1c7d00281d504e}, intrahash = {6c473593fb96c55688702d76fd4039b3}, journal = {IEICE Trans. Electron.}, keywords = {dblp}, number = 10, pages = {1713-1716}, timestamp = {2020-04-14T11:47:26.000+0200}, title = {A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet91c.html#KimKKK08}, volume = {91-C}, year = 2008 }