%0 Conference Paper %1 conf/vts/KrishnaS92 %A Krishna, C. Mani %A Singh, Adit D. %B VTS %D 1992 %I IEEE Computer Society %K dblp %P 176-181 %T Analysis of the die test optimization algorithm for negative binomial yield statistics. %U http://dblp.uni-trier.de/db/conf/vts/vts1992.html#KrishnaS92 %@ 0-7803-0623-6

@inproceedings{conf/vts/KrishnaS92, added-at = {2023-03-24T00:00:00.000+0100}, author = {Krishna, C. Mani and Singh, Adit D.}, biburl = {https://www.bibsonomy.org/bibtex/27c3f084096ee3d44e5e0a6788bfff94a/dblp}, booktitle = {VTS}, crossref = {conf/vts/1992}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTEST.1992.232745}, interhash = {ca05aa3863e00ae02cacb7e925220b07}, intrahash = {7c3f084096ee3d44e5e0a6788bfff94a}, isbn = {0-7803-0623-6}, keywords = {dblp}, pages = {176-181}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T07:35:02.000+0200}, title = {Analysis of the die test optimization algorithm for negative binomial yield statistics.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts1992.html#KrishnaS92}, year = 1992 }