%0 Journal Article %1 journals/et/DuLSHL18 %A Du, Xiaozhi %A Luo, Dongyang %A Shi, Kailun %A He, Chaohui %A Liu, Shuhuan %D 2018 %J J. Electron. Test. %K dblp %N 1 %P 15-25 %T FFI4SoC: a Fine-Grained Fault Injection Framework for Assessing Reliability against Soft Error in SoC. %U http://dblp.uni-trier.de/db/journals/et/et34.html#DuLSHL18 %V 34

@article{journals/et/DuLSHL18, added-at = {2023-09-30T00:00:00.000+0200}, author = {Du, Xiaozhi and Luo, Dongyang and Shi, Kailun and He, Chaohui and Liu, Shuhuan}, biburl = {https://www.bibsonomy.org/bibtex/254580e892c9cdceebb5538f380650b5f/dblp}, ee = {https://doi.org/10.1007/s10836-017-5702-9}, interhash = {cb6a260167427dd232c43851b1f4f50e}, intrahash = {54580e892c9cdceebb5538f380650b5f}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 1, pages = {15-25}, timestamp = {2024-04-08T20:52:26.000+0200}, title = {FFI4SoC: a Fine-Grained Fault Injection Framework for Assessing Reliability against Soft Error in SoC.}, url = {http://dblp.uni-trier.de/db/journals/et/et34.html#DuLSHL18}, volume = 34, year = 2018 }