%0 Conference Paper %1 conf/fsdm/LuLZ17 %A feng Lü, Wei %A Lin, Mi %A Zhang, Haipeng %B FSDM %D 2017 %E Tallón-Ballesteros, Antonio J. %E Li, Kaicheng %I IOS Press %K dblp %P 398-403 %T Investigation on Gate Capacitances Fluctuation Due to Work-Function Variation in Metal-Gate FinFETs. %U http://dblp.uni-trier.de/db/conf/fsdm/fsdm2017.html#LuLZ17 %V 299 %@ 978-1-61499-828-0

@inproceedings{conf/fsdm/LuLZ17, added-at = {2017-12-08T00:00:00.000+0100}, author = {feng Lü, Wei and Lin, Mi and Zhang, Haipeng}, biburl = {https://www.bibsonomy.org/bibtex/2402c7183a1d4bccdf7c2cad9f19b72d4/dblp}, booktitle = {FSDM}, crossref = {conf/fsdm/2017}, editor = {Tallón-Ballesteros, Antonio J. and Li, Kaicheng}, ee = {https://doi.org/10.3233/978-1-61499-828-0-398}, interhash = {cc2a19ec8937c1b611e0db5b95ce6b03}, intrahash = {402c7183a1d4bccdf7c2cad9f19b72d4}, isbn = {978-1-61499-828-0}, keywords = {dblp}, pages = {398-403}, publisher = {IOS Press}, series = {Frontiers in Artificial Intelligence and Applications}, timestamp = {2017-12-12T11:37:22.000+0100}, title = {Investigation on Gate Capacitances Fluctuation Due to Work-Function Variation in Metal-Gate FinFETs.}, url = {http://dblp.uni-trier.de/db/conf/fsdm/fsdm2017.html#LuLZ17}, volume = 299, year = 2017 }