%0 Journal Article %1 journals/mr/DouSNKAKNSWTNI14 %A Dou, Chunmeng %A Shoji, Tomoya %A Nakajima, Kazuhiro %A Kakushima, Kuniyuki %A Ahmet, Parhat %A Kataoka, Yoshinori %A Nishiyama, Akira %A Sugii, Nobuyuki %A Wakabayashi, Hitoshi %A Tsutsui, Kazuo %A Natori, Kenji %A Iwai, Hiroshi %D 2014 %J Microelectron. Reliab. %K dblp %N 4 %P 725-729 %T Characterization of interface state density of three-dimensional Si nanostructure by charge pumping measurement. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#DouSNKAKNSWTNI14 %V 54

@article{journals/mr/DouSNKAKNSWTNI14, added-at = {2021-10-14T00:00:00.000+0200}, author = {Dou, Chunmeng and Shoji, Tomoya and Nakajima, Kazuhiro and Kakushima, Kuniyuki and Ahmet, Parhat and Kataoka, Yoshinori and Nishiyama, Akira and Sugii, Nobuyuki and Wakabayashi, Hitoshi and Tsutsui, Kazuo and Natori, Kenji and Iwai, Hiroshi}, biburl = {https://www.bibsonomy.org/bibtex/2144039d228de7fad3479a597c00b2223/dblp}, ee = {https://doi.org/10.1016/j.microrel.2013.11.016}, interhash = {cd6294b3b36f239c5e80f51d2a829fca}, intrahash = {144039d228de7fad3479a597c00b2223}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 4, pages = {725-729}, timestamp = {2024-04-09T02:49:59.000+0200}, title = {Characterization of interface state density of three-dimensional Si nanostructure by charge pumping measurement.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#DouSNKAKNSWTNI14}, volume = 54, year = 2014 }