%0 Journal Article %1 journals/dt/KrishnaswamyMH07 %A Krishnaswamy, Smita %A Markov, Igor L. %A Hayes, John P. %D 2007 %J IEEE Des. Test Comput. %K dblp %N 4 %P 312-321 %T Tracking Uncertainty with Probabilistic Logic Circuit Testing. %U http://dblp.uni-trier.de/db/journals/dt/dt24.html#KrishnaswamyMH07 %V 24

@article{journals/dt/KrishnaswamyMH07, added-at = {2020-05-17T00:00:00.000+0200}, author = {Krishnaswamy, Smita and Markov, Igor L. and Hayes, John P.}, biburl = {https://www.bibsonomy.org/bibtex/2a6a9bba3b581adc558aef931bc30e5f0/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/MDT.2007.146}, interhash = {cf1887420ef895b168141f1466daab5d}, intrahash = {a6a9bba3b581adc558aef931bc30e5f0}, journal = {IEEE Des. Test Comput.}, keywords = {dblp}, number = 4, pages = {312-321}, timestamp = {2020-05-19T12:19:20.000+0200}, title = {Tracking Uncertainty with Probabilistic Logic Circuit Testing.}, url = {http://dblp.uni-trier.de/db/journals/dt/dt24.html#KrishnaswamyMH07}, volume = 24, year = 2007 }