%0 Journal Article %1 journals/tc/SuC72 %A Su, Stephen Y. H. %A Cho, Yun-Chung %D 1972 %J IEEE Trans. Computers %K dblp %N 1 %P 21-30 %T A New Approach to the Fault Location of Combinational Circuits. %U http://dblp.uni-trier.de/db/journals/tc/tc21.html#SuC72 %V 21

@article{journals/tc/SuC72, added-at = {2016-08-11T00:00:00.000+0200}, author = {Su, Stephen Y. H. and Cho, Yun-Chung}, biburl = {https://www.bibsonomy.org/bibtex/248e1dc18fc0cf6bc8851292e9bd90ebe/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/T-C.1972.223427}, interhash = {d65a66000cb735c17cd479d5c5f6a57a}, intrahash = {48e1dc18fc0cf6bc8851292e9bd90ebe}, journal = {IEEE Trans. Computers}, keywords = {dblp}, number = 1, pages = {21-30}, timestamp = {2016-08-12T11:35:44.000+0200}, title = {A New Approach to the Fault Location of Combinational Circuits.}, url = {http://dblp.uni-trier.de/db/journals/tc/tc21.html#SuC72}, volume = 21, year = 1972 }