%0 Conference Paper %1 conf/vdat/ShahYV17 %A Shah, Ambika Prasad %A Yadav, Nandakishor %A Vishvakarma, Santosh Kumar %B VDAT %D 2017 %E Kaushik, Brajesh Kumar %E Dasgupta, Sudeb %E Singh, Virendra %I Springer %K dblp %P 441-451 %T LISOCHIN: An NBTI Degradation Monitoring Sensor for Reliable CMOS Circuits. %U http://dblp.uni-trier.de/db/conf/vdat/vdat2017.html#ShahYV17 %V 711 %@ 978-981-10-7470-7

@inproceedings{conf/vdat/ShahYV17, added-at = {2019-10-19T00:00:00.000+0200}, author = {Shah, Ambika Prasad and Yadav, Nandakishor and Vishvakarma, Santosh Kumar}, biburl = {https://www.bibsonomy.org/bibtex/2c367830f7dfb08aa9e01ddfc83c05bc4/dblp}, booktitle = {VDAT}, crossref = {conf/vdat/2017}, editor = {Kaushik, Brajesh Kumar and Dasgupta, Sudeb and Singh, Virendra}, ee = {https://doi.org/10.1007/978-981-10-7470-7_44}, interhash = {d80e4b2640009dafae530d48e3e5a7af}, intrahash = {c367830f7dfb08aa9e01ddfc83c05bc4}, isbn = {978-981-10-7470-7}, keywords = {dblp}, pages = {441-451}, publisher = {Springer}, series = {Communications in Computer and Information Science}, timestamp = {2019-10-22T13:51:37.000+0200}, title = {LISOCHIN: An NBTI Degradation Monitoring Sensor for Reliable CMOS Circuits.}, url = {http://dblp.uni-trier.de/db/conf/vdat/vdat2017.html#ShahYV17}, volume = 711, year = 2017 }