%0 Conference Paper %1 conf/ets/BonhommeYFG04 %A Bonhomme, Yannick %A Yoneda, Tomokazu %A Fujiwara, Hideo %A Girard, Patrick %B ETS %D 2004 %I IEEE Computer Society %K dblp %P 174-179 %T An efficient scan tree design for test time reduction. %U http://dblp.uni-trier.de/db/conf/ets/ets2004.html#BonhommeYFG04 %@ 0-7695-2119-3

@inproceedings{conf/ets/BonhommeYFG04, added-at = {2023-03-23T00:00:00.000+0100}, author = {Bonhomme, Yannick and Yoneda, Tomokazu and Fujiwara, Hideo and Girard, Patrick}, biburl = {https://www.bibsonomy.org/bibtex/211d122f42665bd736d90e4ba47c532a4/dblp}, booktitle = {ETS}, crossref = {conf/ets/2004}, ee = {https://doi.ieeecomputersociety.org/10.1109/ETSYM.2004.1347657}, interhash = {da15cc2ac43a2baca3d1b2656a980220}, intrahash = {11d122f42665bd736d90e4ba47c532a4}, isbn = {0-7695-2119-3}, keywords = {dblp}, pages = {174-179}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T20:47:59.000+0200}, title = {An efficient scan tree design for test time reduction.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2004.html#BonhommeYFG04}, year = 2004 }