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%0 Conference Paper
%1 conf/irps/FeilRKAGG22
%A Feil, Maximilian W.
%A Reisinger, Hans
%A Kabakow, André
%A Aichinger, Thomas
%A Gustin, Wolfgang
%A Grasser, Tibor
%B IRPS
%D 2022
%I IEEE
%K dblp
%P 3
%T Optical Emission Correlated to Bias Temperature Instability in SiC MOSFETs.
%U http://dblp.uni-trier.de/db/conf/irps/irps2022.html#FeilRKAGG22
%@ 978-1-6654-7950-9
@inproceedings{conf/irps/FeilRKAGG22,
added-at = {2022-10-02T00:00:00.000+0200},
author = {Feil, Maximilian W. and Reisinger, Hans and Kabakow, André and Aichinger, Thomas and Gustin, Wolfgang and Grasser, Tibor},
biburl = {https://www.bibsonomy.org/bibtex/2d013e7d251dff18d2b0a1228cd342546/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2022},
ee = {https://doi.org/10.1109/IRPS48227.2022.9764584},
interhash = {dc193c54b448635e95f341c1a18eab4b},
intrahash = {d013e7d251dff18d2b0a1228cd342546},
isbn = {978-1-6654-7950-9},
keywords = {dblp},
pages = 3,
publisher = {IEEE},
timestamp = {2024-04-09T12:18:58.000+0200},
title = {Optical Emission Correlated to Bias Temperature Instability in SiC MOSFETs.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2022.html#FeilRKAGG22},
year = 2022
}