%0 Conference Paper %1 conf/icess/QinCS08 %A Qin, Zhidong %A Chen, Hui %A Shi, Youqun %B ICESS %D 2008 %E Bhattacharyya, Shuvra S. %E Zhou, Xingshe %E Guo, Bing %E Shao, Zili %E Liao, Xiangke %I IEEE Computer Society %K dblp %P 481-487 %T Reliability Demonstration Testing Method for Safety-Critical Embedded Applications Software. %U http://dblp.uni-trier.de/db/conf/icess/icess2008.html#QinCS08 %@ 978-0-7695-3287-5

@inproceedings{conf/icess/QinCS08, added-at = {2023-03-24T00:00:00.000+0100}, author = {Qin, Zhidong and Chen, Hui and Shi, Youqun}, biburl = {https://www.bibsonomy.org/bibtex/2ddf1f42c226102a64fb2b502d34cc35a/dblp}, booktitle = {ICESS}, crossref = {conf/icess/2008}, editor = {Bhattacharyya, Shuvra S. and Zhou, Xingshe and Guo, Bing and Shao, Zili and Liao, Xiangke}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICESS.2008.76}, interhash = {dc70f20a632af4b6842c94b78e301b2c}, intrahash = {ddf1f42c226102a64fb2b502d34cc35a}, isbn = {978-0-7695-3287-5}, keywords = {dblp}, pages = {481-487}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:30:53.000+0200}, title = {Reliability Demonstration Testing Method for Safety-Critical Embedded Applications Software.}, url = {http://dblp.uni-trier.de/db/conf/icess/icess2008.html#QinCS08}, year = 2008 }