%0 Journal Article %1 journals/tr/TsaiSLCL16 %A Tsai, Tzong-Ru %A Sung, Wen-Yun %A Lio, Yuhlong %A Chang, Shing I. %A Lu, Jye-Chyi %D 2016 %J IEEE Trans. Reliability %K dblp %N 1 %P 459-468 %T Optimal Two-Variable Accelerated Degradation Test Plan for Gamma Degradation Processes. %U http://dblp.uni-trier.de/db/journals/tr/tr65.html#TsaiSLCL16 %V 65

@article{journals/tr/TsaiSLCL16, added-at = {2019-10-19T00:00:00.000+0200}, author = {Tsai, Tzong-Ru and Sung, Wen-Yun and Lio, Yuhlong and Chang, Shing I. and Lu, Jye-Chyi}, biburl = {https://www.bibsonomy.org/bibtex/234b22dfd01f5cd2bdf275dec61f4f472/dblp}, ee = {https://doi.org/10.1109/TR.2015.2435774}, interhash = {de9e35be4855d5c42b3a33c2a9e1caa7}, intrahash = {34b22dfd01f5cd2bdf275dec61f4f472}, journal = {IEEE Trans. Reliability}, keywords = {dblp}, number = 1, pages = {459-468}, timestamp = {2019-10-22T11:52:21.000+0200}, title = {Optimal Two-Variable Accelerated Degradation Test Plan for Gamma Degradation Processes.}, url = {http://dblp.uni-trier.de/db/journals/tr/tr65.html#TsaiSLCL16}, volume = 65, year = 2016 }