%0 Journal Article %1 journals/mr/CilentoSYMLCG10 %A Cilento, Tommaso %A Schenkel, M. %A Yun, C. %A Mishra, R. %A Li, Junjun %A Chatty, Kiran V. %A Gauthier, Robert %D 2010 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1367-1372 %T Simulation of ESD protection devices in an advanced CMOS technology using a TCAD workbench based on an ESD calibration methodology. %U http://dblp.uni-trier.de/db/journals/mr/mr50.html#CilentoSYMLCG10 %V 50

@article{journals/mr/CilentoSYMLCG10, added-at = {2023-02-02T00:00:00.000+0100}, author = {Cilento, Tommaso and Schenkel, M. and Yun, C. and Mishra, R. and Li, Junjun and Chatty, Kiran V. and Gauthier, Robert}, biburl = {https://www.bibsonomy.org/bibtex/238aebf077be510fe1808bc11374d06e7/dblp}, ee = {https://doi.org/10.1016/j.microrel.2010.07.132}, interhash = {df1dbdb9b69105087d6f782e48355ae1}, intrahash = {38aebf077be510fe1808bc11374d06e7}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1367-1372}, timestamp = {2024-04-09T02:49:13.000+0200}, title = {Simulation of ESD protection devices in an advanced CMOS technology using a TCAD workbench based on an ESD calibration methodology.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#CilentoSYMLCG10}, volume = 50, year = 2010 }