%0 Journal Article %1 journals/spl/KimLC09 %A Kim, Hong Il %A Lee, Sang Hwa %A Cho, Nam Ik %D 2009 %J IEEE Signal Process. Lett. %K dblp %N 5 %P 374-377 %T Automatic Defect Classification Using Frequency and Spatial Features in a Boosting Scheme. %U http://dblp.uni-trier.de/db/journals/spl/spl16.html#KimLC09 %V 16

@article{journals/spl/KimLC09, added-at = {2018-11-02T00:00:00.000+0100}, author = {Kim, Hong Il and Lee, Sang Hwa and Cho, Nam Ik}, biburl = {https://www.bibsonomy.org/bibtex/25e2a22146ae3370bda838fd175a70e35/dblp}, ee = {https://doi.org/10.1109/LSP.2009.2016467}, interhash = {e02676a7b2649ac1a93f7d1263f34867}, intrahash = {5e2a22146ae3370bda838fd175a70e35}, journal = {IEEE Signal Process. Lett.}, keywords = {dblp}, number = 5, pages = {374-377}, timestamp = {2018-11-03T12:22:28.000+0100}, title = {Automatic Defect Classification Using Frequency and Spatial Features in a Boosting Scheme.}, url = {http://dblp.uni-trier.de/db/journals/spl/spl16.html#KimLC09}, volume = 16, year = 2009 }