%0 Journal Article %1 journals/ieicet/DevlinIA13 %A Devlin, Benjamin Stefan %A Ikeda, Makoto %A Asada, Kunihiro %D 2013 %J IEICE Trans. Electron. %K dblp %N 4 %P 518-527 %T Self Synchronous Circuits for Robust Operation in Low Voltage and Soft Error Prone Environments. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet96c.html#DevlinIA13 %V 96-C

@article{journals/ieicet/DevlinIA13, added-at = {2020-04-11T00:00:00.000+0200}, author = {Devlin, Benjamin Stefan and Ikeda, Makoto and Asada, Kunihiro}, biburl = {https://www.bibsonomy.org/bibtex/27c2c6622335bb4f6ca20d2b604c9dcbe/dblp}, ee = {http://search.ieice.org/bin/summary.php?id=e96-c_4_518}, interhash = {1e153fea76ba60e1bc46eac05b22e62e}, intrahash = {7c2c6622335bb4f6ca20d2b604c9dcbe}, journal = {IEICE Trans. Electron.}, keywords = {dblp}, number = 4, pages = {518-527}, timestamp = {2020-04-14T11:45:25.000+0200}, title = {Self Synchronous Circuits for Robust Operation in Low Voltage and Soft Error Prone Environments.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet96c.html#DevlinIA13}, volume = {96-C}, year = 2013 }