%0 Journal Article %1 journals/et/JenaBD21 %A Jena, Sisir Kumar %A Biswas, Santosh %A Deka, Jatindra Kumar %D 2021 %J J. Electron. Test. %K dblp %N 5 %P 633-652 %T Retesting Defective Circuits to Allow Acceptable Faults for Yield Enhancement. %U http://dblp.uni-trier.de/db/journals/et/et37.html#JenaBD21 %V 37

@article{journals/et/JenaBD21, added-at = {2022-02-23T00:00:00.000+0100}, author = {Jena, Sisir Kumar and Biswas, Santosh and Deka, Jatindra Kumar}, biburl = {https://www.bibsonomy.org/bibtex/2de4e85856f0e953b67c3394f46acfdb2/dblp}, ee = {https://doi.org/10.1007/s10836-021-05980-y}, interhash = {e183f7ff61963cb4c579b367d1cd40d0}, intrahash = {de4e85856f0e953b67c3394f46acfdb2}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 5, pages = {633-652}, timestamp = {2024-04-08T20:52:19.000+0200}, title = {Retesting Defective Circuits to Allow Acceptable Faults for Yield Enhancement.}, url = {http://dblp.uni-trier.de/db/journals/et/et37.html#JenaBD21}, volume = 37, year = 2021 }