Inproceedings,
Hierarchical Analysis of Short Defects between Metal Lines in CMOS IC.
W. Pleskacz, M. Jenihhin, J. Raik, M. Rakowski, R. Ubar, and W. Kuzmicz.DSD, page 729-734. IEEE Computer Society, (2008)
Meta data
- BibTeX key
- conf/dsd/PleskaczJRRUK08
- entry type
- inproceedings
- booktitle
- DSD
- year
- 2008
- pages
- 729-734
- publisher
- IEEE Computer Society
- crossref
- conf/dsd/2008
- ee
- https://doi.ieeecomputersociety.org/10.1109/DSD.2008.98
- isbn
- 978-0-7695-3277-6
- url
- http://dblp.uni-trier.de/db/conf/dsd/dsd2008.html#PleskaczJRRUK08
Tags
Users
Comments and Reviewsshow / hide
Cite this publication
More citation styles
- please select -%0 Conference Paper
%1 conf/dsd/PleskaczJRRUK08
%A Pleskacz, Witold A.
%A Jenihhin, Maksim
%A Raik, Jaan
%A Rakowski, Michal
%A Ubar, Raimund
%A Kuzmicz, Wieslaw
%B DSD
%D 2008
%E Fanucci, Luca
%I IEEE Computer Society
%K dblp
%P 729-734
%T Hierarchical Analysis of Short Defects between Metal Lines in CMOS IC.
%U http://dblp.uni-trier.de/db/conf/dsd/dsd2008.html#PleskaczJRRUK08
%@ 978-0-7695-3277-6
@inproceedings{conf/dsd/PleskaczJRRUK08,
added-at = {2023-03-23T00:00:00.000+0100},
author = {Pleskacz, Witold A. and Jenihhin, Maksim and Raik, Jaan and Rakowski, Michal and Ubar, Raimund and Kuzmicz, Wieslaw},
biburl = {https://www.bibsonomy.org/bibtex/2ab83d164e38be44f29b5686ec3933f58/dblp},
booktitle = {DSD},
crossref = {conf/dsd/2008},
editor = {Fanucci, Luca},
ee = {https://doi.ieeecomputersociety.org/10.1109/DSD.2008.98},
interhash = {e41d32fa138e443bebd7c22c3e5d0e57},
intrahash = {ab83d164e38be44f29b5686ec3933f58},
isbn = {978-0-7695-3277-6},
keywords = {dblp},
pages = {729-734},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T14:05:12.000+0200},
title = {Hierarchical Analysis of Short Defects between Metal Lines in CMOS IC.},
url = {http://dblp.uni-trier.de/db/conf/dsd/dsd2008.html#PleskaczJRRUK08},
year = 2008
}