%0 Journal Article %1 journals/tcad/ChakrabartyM98 %A Chakrabarty, Krishnendu %A Murray, Brian T. %D 1998 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 10 %P 1044-1051 %T Design of built-in test generator circuits using width compression. %U http://dblp.uni-trier.de/db/journals/tcad/tcad17.html#ChakrabartyM98 %V 17

@article{journals/tcad/ChakrabartyM98, added-at = {2022-01-03T00:00:00.000+0100}, author = {Chakrabarty, Krishnendu and Murray, Brian T.}, biburl = {https://www.bibsonomy.org/bibtex/294e0368af19ae350ba95f2db052647d6/dblp}, ee = {https://doi.org/10.1109/43.728923}, interhash = {e4b6a8637b334dd4dd0b7015b90d81c9}, intrahash = {94e0368af19ae350ba95f2db052647d6}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 10, pages = {1044-1051}, timestamp = {2024-04-08T19:46:45.000+0200}, title = {Design of built-in test generator circuits using width compression.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad17.html#ChakrabartyM98}, volume = 17, year = 1998 }