Meta data
- BibTeX key
- conf/irps/WangZZXMZHXDL20
- entry type
- inproceedings
- booktitle
- IRPS
- year
- 2020
- pages
- 1-4
- publisher
- IEEE
- crossref
- conf/irps/2020
- ee
- https://doi.org/10.1109/IRPS45951.2020.9128350
- isbn
- 978-1-7281-3199-3
- url
- http://dblp.uni-trier.de/db/conf/irps/irps2020.html#WangZZXMZHXDL20
Tags
Users
Comments and Reviewsshow / hide
Cite this publication
More citation styles
- please select -%0 Conference Paper
%1 conf/irps/WangZZXMZHXDL20
%A Wang, Yingzhe
%A Zheng, Xuefeng
%A Zhu, Jiaduo
%A Xu, Shengrui
%A Ma, Xiaohua
%A Zhang, Jincheng
%A Hao, Yue
%A Xu, Linlin
%A Dai, Jiangnan
%A Li, Peixian
%B IRPS
%D 2020
%I IEEE
%K dblp
%P 1-4
%T Evolution of Defect in AlGaN-based Deep Ultraviolet Light Emitting Diodes During Electrical Stress.
%U http://dblp.uni-trier.de/db/conf/irps/irps2020.html#WangZZXMZHXDL20
%@ 978-1-7281-3199-3
@inproceedings{conf/irps/WangZZXMZHXDL20,
added-at = {2020-07-30T00:00:00.000+0200},
author = {Wang, Yingzhe and Zheng, Xuefeng and Zhu, Jiaduo and Xu, Shengrui and Ma, Xiaohua and Zhang, Jincheng and Hao, Yue and Xu, Linlin and Dai, Jiangnan and Li, Peixian},
biburl = {https://www.bibsonomy.org/bibtex/2321850e4ae2b63daf60a941e7a1151fe/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2020},
ee = {https://doi.org/10.1109/IRPS45951.2020.9128350},
interhash = {e7bb973ecc79a7b5dcf80f741bd5f8a3},
intrahash = {321850e4ae2b63daf60a941e7a1151fe},
isbn = {978-1-7281-3199-3},
keywords = {dblp},
pages = {1-4},
publisher = {IEEE},
timestamp = {2020-07-31T11:52:08.000+0200},
title = {Evolution of Defect in AlGaN-based Deep Ultraviolet Light Emitting Diodes During Electrical Stress.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2020.html#WangZZXMZHXDL20},
year = 2020
}