%0 Journal Article %1 journals/mr/SuMWWP11 %A Su, Fei %A Mao, Ronghai %A Wang, Xiaoyan %A Wang, Guangzhou %A Pan, Haiyan %D 2011 %J Microelectron. Reliab. %K dblp %N 5 %P 1020-1024 %T Creep behaviour of Sn-3.8Ag-0.7Cu under the effect of electromigration: Experiments and modelling. %U http://dblp.uni-trier.de/db/journals/mr/mr51.html#SuMWWP11 %V 51

@article{journals/mr/SuMWWP11, added-at = {2020-02-22T00:00:00.000+0100}, author = {Su, Fei and Mao, Ronghai and Wang, Xiaoyan and Wang, Guangzhou and Pan, Haiyan}, biburl = {https://www.bibsonomy.org/bibtex/292b6b8b05defc99301930687bdf017e0/dblp}, ee = {https://doi.org/10.1016/j.microrel.2011.01.010}, interhash = {edafabb90dd617f0efe61929097d5e54}, intrahash = {92b6b8b05defc99301930687bdf017e0}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 5, pages = {1020-1024}, timestamp = {2020-02-25T13:28:02.000+0100}, title = {Creep behaviour of Sn-3.8Ag-0.7Cu under the effect of electromigration: Experiments and modelling.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#SuMWWP11}, volume = 51, year = 2011 }