%0 Conference Paper %1 conf/itc/LeenstraS90 %A Leenstra, Jens %A Spaanenburg, Lambert %B ITC %D 1990 %I IEEE Computer Society %K dblp %P 520-529 %T Hierarchical test assembly for macro based VLSI design. %U http://dblp.uni-trier.de/db/conf/itc/itc1990.html#LeenstraS90 %@ 0-8186-9064-X

@inproceedings{conf/itc/LeenstraS90, added-at = {2023-03-23T00:00:00.000+0100}, author = {Leenstra, Jens and Spaanenburg, Lambert}, biburl = {https://www.bibsonomy.org/bibtex/281002b3755f6e075097e28c4b89ceec8/dblp}, booktitle = {ITC}, crossref = {conf/itc/1990}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1990.114063}, interhash = {edfb503b4ad22e058b79fc86af9115ba}, intrahash = {81002b3755f6e075097e28c4b89ceec8}, isbn = {0-8186-9064-X}, keywords = {dblp}, pages = {520-529}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:52:40.000+0200}, title = {Hierarchical test assembly for macro based VLSI design.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1990.html#LeenstraS90}, year = 1990 }