%0 Journal Article %1 journals/mr/LiuMSYW09 %A Liu, Xiaoxiao %A Ma, Guangsheng %A Shao, Jingbo %A Yang, Zhi %A Wang, Guanjun %D 2009 %J Microelectron. Reliab. %K dblp %N 2 %P 170-177 %T Interconnect crosstalk noise evaluation in deep-submicron technologies. %U http://dblp.uni-trier.de/db/journals/mr/mr49.html#LiuMSYW09 %V 49

@article{journals/mr/LiuMSYW09, added-at = {2020-02-22T00:00:00.000+0100}, author = {Liu, Xiaoxiao and Ma, Guangsheng and Shao, Jingbo and Yang, Zhi and Wang, Guanjun}, biburl = {https://www.bibsonomy.org/bibtex/218f2599229bdeeab53cc4d5e933a5515/dblp}, ee = {https://doi.org/10.1016/j.microrel.2008.11.013}, interhash = {ee0ce1f94e83f682d0fd841ca112b4ed}, intrahash = {18f2599229bdeeab53cc4d5e933a5515}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 2, pages = {170-177}, timestamp = {2020-02-25T13:28:32.000+0100}, title = {Interconnect crosstalk noise evaluation in deep-submicron technologies.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr49.html#LiuMSYW09}, volume = 49, year = 2009 }