%0 Conference Paper %1 conf/ets/PoehlDAO10 %A Poehl, Frank %A Demmerle, Frank %A Alt, Juergen %A Obermeir, Hermann %B European Test Symposium %D 2010 %I IEEE Computer Society %K dblp %P 17-22 %T Production test challenges for highly integrated mobile phone SOCs - A case study. %U http://dblp.uni-trier.de/db/conf/ets/ets2010.html#PoehlDAO10 %@ 978-1-4244-5833-2

@inproceedings{conf/ets/PoehlDAO10, added-at = {2017-05-22T00:00:00.000+0200}, author = {Poehl, Frank and Demmerle, Frank and Alt, Juergen and Obermeir, Hermann}, biburl = {https://www.bibsonomy.org/bibtex/299fb5b00d9ca1b16204edb7b2e71d49e/dblp}, booktitle = {European Test Symposium}, crossref = {conf/ets/2010}, ee = {https://doi.org/10.1109/ETSYM.2010.5512786}, interhash = {f22597371ae90b9bcb3d6f23fec0f557}, intrahash = {99fb5b00d9ca1b16204edb7b2e71d49e}, isbn = {978-1-4244-5833-2}, keywords = {dblp}, pages = {17-22}, publisher = {IEEE Computer Society}, timestamp = {2019-10-17T15:59:35.000+0200}, title = {Production test challenges for highly integrated mobile phone SOCs - A case study.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2010.html#PoehlDAO10}, year = 2010 }