%0 Conference Paper %1 conf/apccas/ChenZWKXPMQZ22 %A Chen, Langtao %A Zhou, Xin %A Wang, Ying %A Kong, Ying %A Xie, Rubin %A Peng, Ling %A Mo, Yantu %A Qiao, Ming %A Zhang, Bo %B APCCAS %D 2022 %I IEEE %K dblp %P 588-591 %T Study on Single Event Burnout Effect for 18V LDMOS Based on 0.18µm Process Technology. %U http://dblp.uni-trier.de/db/conf/apccas/apccas2022.html#ChenZWKXPMQZ22 %@ 978-1-6654-5073-7

@inproceedings{conf/apccas/ChenZWKXPMQZ22, added-at = {2023-04-22T00:00:00.000+0200}, author = {Chen, Langtao and Zhou, Xin and Wang, Ying and Kong, Ying and Xie, Rubin and Peng, Ling and Mo, Yantu and Qiao, Ming and Zhang, Bo}, biburl = {https://www.bibsonomy.org/bibtex/2be00487480c340cf74f948641c9f02aa/dblp}, booktitle = {APCCAS}, crossref = {conf/apccas/2022}, ee = {https://doi.org/10.1109/APCCAS55924.2022.10090399}, interhash = {f2988dc6e574806a6f57b8d95799436f}, intrahash = {be00487480c340cf74f948641c9f02aa}, isbn = {978-1-6654-5073-7}, keywords = {dblp}, pages = {588-591}, publisher = {IEEE}, timestamp = {2024-04-10T01:57:01.000+0200}, title = {Study on Single Event Burnout Effect for 18V LDMOS Based on 0.18µm Process Technology.}, url = {http://dblp.uni-trier.de/db/conf/apccas/apccas2022.html#ChenZWKXPMQZ22}, year = 2022 }