%0 Journal Article %1 journals/tie/WangSL22 %A Wang, Xianzhi %A Si, Shubin %A Li, Yongbo %D 2022 %J IEEE Trans. Ind. Electron. %K dblp %N 3 %P 3109-3119 %T Variational Embedding Multiscale Diversity Entropy for Fault Diagnosis of Large-Scale Machinery. %U http://dblp.uni-trier.de/db/journals/tie/tie69.html#WangSL22 %V 69

@article{journals/tie/WangSL22, added-at = {2021-12-25T00:00:00.000+0100}, author = {Wang, Xianzhi and Si, Shubin and Li, Yongbo}, biburl = {https://www.bibsonomy.org/bibtex/27b3a251ff26ff0c600a74fcd15d5fa44/dblp}, ee = {https://doi.org/10.1109/TIE.2021.3063979}, interhash = {f31d18b4aa5bbe7188fb2d81ca5f09fa}, intrahash = {7b3a251ff26ff0c600a74fcd15d5fa44}, journal = {IEEE Trans. Ind. Electron.}, keywords = {dblp}, number = 3, pages = {3109-3119}, timestamp = {2024-04-08T10:27:50.000+0200}, title = {Variational Embedding Multiscale Diversity Entropy for Fault Diagnosis of Large-Scale Machinery.}, url = {http://dblp.uni-trier.de/db/journals/tie/tie69.html#WangSL22}, volume = 69, year = 2022 }