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%0 Conference Paper
%1 conf/itc/ChenKWSRM01
%A Chen, John T.
%A Khare, Jitendra
%A Walker, Ken
%A Shaikh, Saghir A.
%A Rajski, Janusz
%A Maly, Wojciech
%B ITC
%D 2001
%I IEEE Computer Society
%K dblp
%P 258-267
%T Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring.
%U http://dblp.uni-trier.de/db/conf/itc/itc2001.html#ChenKWSRM01
%@ 0-7803-7169-0
@inproceedings{conf/itc/ChenKWSRM01,
added-at = {2023-03-23T00:00:00.000+0100},
author = {Chen, John T. and Khare, Jitendra and Walker, Ken and Shaikh, Saghir A. and Rajski, Janusz and Maly, Wojciech},
biburl = {https://www.bibsonomy.org/bibtex/2de80a2698bd783353cd3abebdb28f630/dblp},
booktitle = {ITC},
crossref = {conf/itc/2001},
ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2001.966641},
interhash = {f399cdb417a4f20845136d0398410986},
intrahash = {de80a2698bd783353cd3abebdb28f630},
isbn = {0-7803-7169-0},
keywords = {dblp},
pages = {258-267},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T04:28:56.000+0200},
title = {Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2001.html#ChenKWSRM01},
year = 2001
}