%0 Journal Article %1 journals/tii/WenWL22 %A Wen, Long %A Wang, You %A Li, Xinyu %D 2022 %J IEEE Trans. Ind. Informatics %K dblp %N 12 %P 8988-8998 %T A New Cycle-consistent Adversarial Networks With Attention Mechanism for Surface Defect Classification With Small Samples. %U http://dblp.uni-trier.de/db/journals/tii/tii18.html#WenWL22 %V 18

@article{journals/tii/WenWL22, added-at = {2022-10-18T00:00:00.000+0200}, author = {Wen, Long and Wang, You and Li, Xinyu}, biburl = {https://www.bibsonomy.org/bibtex/2f6d58ce91f452bc31e4eb0282ac318f4/dblp}, ee = {https://doi.org/10.1109/TII.2022.3168432}, interhash = {f5b3a1b91203ea8ee2589eaf586b4f45}, intrahash = {f6d58ce91f452bc31e4eb0282ac318f4}, journal = {IEEE Trans. Ind. Informatics}, keywords = {dblp}, number = 12, pages = {8988-8998}, timestamp = {2024-04-08T15:02:42.000+0200}, title = {A New Cycle-consistent Adversarial Networks With Attention Mechanism for Surface Defect Classification With Small Samples.}, url = {http://dblp.uni-trier.de/db/journals/tii/tii18.html#WenWL22}, volume = 18, year = 2022 }