%0 Conference Paper %1 conf/vlsi-dat/LuLHHT14 %A Lu, Shyue-Kung %A Li, Huai-Min %A Hashizume, Masaki %A Hong, Jin-Hua %A Tsai, Zheng-Ru %B VLSI-DAT %D 2014 %I IEEE %K dblp %P 1-4 %T Efficient test length reduction techniques for interposer-based 2.5D ICs. %U http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2014.html#LuLHHT14

@inproceedings{conf/vlsi-dat/LuLHHT14, added-at = {2015-09-28T00:00:00.000+0200}, author = {Lu, Shyue-Kung and Li, Huai-Min and Hashizume, Masaki and Hong, Jin-Hua and Tsai, Zheng-Ru}, biburl = {https://www.bibsonomy.org/bibtex/25dbb47e7ecc79825e3a7963442fc256d/dblp}, booktitle = {VLSI-DAT}, crossref = {conf/vlsi-dat/2014}, ee = {http://dx.doi.org/10.1109/VLSI-DAT.2014.6834878}, interhash = {f763e6f89a1a0a0649850301e8d6e476}, intrahash = {5dbb47e7ecc79825e3a7963442fc256d}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2015-09-29T11:36:18.000+0200}, title = {Efficient test length reduction techniques for interposer-based 2.5D ICs.}, url = {http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2014.html#LuLHHT14}, year = 2014 }