%0 Journal Article %1 journals/jssc/KnoblingerKT01 %A Knoblinger, Gerhard %A Klein, Peter %A Tiebout, Marc %D 2001 %J IEEE J. Solid State Circuits %K dblp %N 5 %P 831-837 %T A new model for thermal channel noise of deep-submicron MOSFETs and its application in RF-CMOS design. %U http://dblp.uni-trier.de/db/journals/jssc/jssc36.html#KnoblingerKT01 %V 36

@article{journals/jssc/KnoblingerKT01, added-at = {2022-04-04T00:00:00.000+0200}, author = {Knoblinger, Gerhard and Klein, Peter and Tiebout, Marc}, biburl = {https://www.bibsonomy.org/bibtex/216f976fa3ec47a021b242df590961be4/dblp}, ee = {https://doi.org/10.1109/4.918922}, interhash = {f9b55aca947eea6afbbfa23c54183467}, intrahash = {16f976fa3ec47a021b242df590961be4}, journal = {IEEE J. Solid State Circuits}, keywords = {dblp}, number = 5, pages = {831-837}, timestamp = {2024-04-08T10:42:08.000+0200}, title = {A new model for thermal channel noise of deep-submicron MOSFETs and its application in RF-CMOS design.}, url = {http://dblp.uni-trier.de/db/journals/jssc/jssc36.html#KnoblingerKT01}, volume = 36, year = 2001 }