%0 Journal Article %1 journals/mr/JankLBFR01 %A Jank, Michael P. M. %A Lemberger, Martin %A Bauer, Anton J. %A Frey, Lothar %A Ryssel, Heiner %D 2001 %J Microelectron. Reliab. %K dblp %N 7 %P 987-990 %T Electrical reliability aspects of through the gate implanted MOS structures with thin oxides. %U http://dblp.uni-trier.de/db/journals/mr/mr41.html#JankLBFR01 %V 41

@article{journals/mr/JankLBFR01, added-at = {2020-02-22T00:00:00.000+0100}, author = {Jank, Michael P. M. and Lemberger, Martin and Bauer, Anton J. and Frey, Lothar and Ryssel, Heiner}, biburl = {https://www.bibsonomy.org/bibtex/278c591052a35500b979489d5027ea899/dblp}, ee = {https://doi.org/10.1016/S0026-2714(01)00053-1}, interhash = {f9d07ba0b1049c40e6f00f01aa69e169}, intrahash = {78c591052a35500b979489d5027ea899}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 7, pages = {987-990}, timestamp = {2020-02-25T13:27:39.000+0100}, title = {Electrical reliability aspects of through the gate implanted MOS structures with thin oxides.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#JankLBFR01}, volume = 41, year = 2001 }