%0 Journal Article %1 journals/tetc/LeeLW22 %A Lee, Kuen-Jong %A Liu, Ching-An %A Wu, Chia-Chi %D 2022 %J IEEE Trans. Emerg. Top. Comput. %K dblp %N 1 %P 373-385 %T A Dynamic-Key Based Secure Scan Architecture for Manufacturing and In-Field IC Testing. %U http://dblp.uni-trier.de/db/journals/tetc/tetc10.html#LeeLW22 %V 10

@article{journals/tetc/LeeLW22, added-at = {2022-04-01T00:00:00.000+0200}, author = {Lee, Kuen-Jong and Liu, Ching-An and Wu, Chia-Chi}, biburl = {https://www.bibsonomy.org/bibtex/23135cc9dc7bcb07b3e2bfed130b71683/dblp}, ee = {https://doi.org/10.1109/TETC.2020.3021820}, interhash = {f9eb76abd1a9cc3e945e2c1c66736e82}, intrahash = {3135cc9dc7bcb07b3e2bfed130b71683}, journal = {IEEE Trans. Emerg. Top. Comput.}, keywords = {dblp}, number = 1, pages = {373-385}, timestamp = {2024-04-08T15:30:28.000+0200}, title = {A Dynamic-Key Based Secure Scan Architecture for Manufacturing and In-Field IC Testing.}, url = {http://dblp.uni-trier.de/db/journals/tetc/tetc10.html#LeeLW22}, volume = 10, year = 2022 }