%0 Journal Article %1 journals/tse/LeeNHKI16 %A Lee, Taek %A Nam, Jaechang %A Han, DongGyun %A Kim, Sunghun %A In, Hoh Peter %D 2016 %J IEEE Trans. Software Eng. %K dblp %N 11 %P 1015-1035 %T Developer Micro Interaction Metrics for Software Defect Prediction. %U http://dblp.uni-trier.de/db/journals/tse/tse42.html#LeeNHKI16 %V 42

@article{journals/tse/LeeNHKI16, added-at = {2022-01-03T00:00:00.000+0100}, author = {Lee, Taek and Nam, Jaechang and Han, DongGyun and Kim, Sunghun and In, Hoh Peter}, biburl = {https://www.bibsonomy.org/bibtex/2496b65bffb334bcb77f721e8609c4c2f/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/TSE.2016.2550458}, interhash = {fa19c32a0c9402d7fa5ecde387b08295}, intrahash = {496b65bffb334bcb77f721e8609c4c2f}, journal = {IEEE Trans. Software Eng.}, keywords = {dblp}, number = 11, pages = {1015-1035}, timestamp = {2024-04-08T21:08:24.000+0200}, title = {Developer Micro Interaction Metrics for Software Defect Prediction.}, url = {http://dblp.uni-trier.de/db/journals/tse/tse42.html#LeeNHKI16}, volume = 42, year = 2016 }