%0 Conference Paper %1 conf/iscas/DuanCG12 %A Duan, Jingbo %A Chen, Degang %A Geiger, Randall L. %B ISCAS %D 2012 %I IEEE %K dblp %P 2023-2026 %T A low cost method for testing offset and gain error for ADC BIST. %U http://dblp.uni-trier.de/db/conf/iscas/iscas2012.html#DuanCG12 %@ 978-1-4673-0218-0

@inproceedings{conf/iscas/DuanCG12, added-at = {2022-07-26T00:00:00.000+0200}, author = {Duan, Jingbo and Chen, Degang and Geiger, Randall L.}, biburl = {https://www.bibsonomy.org/bibtex/213a60ab87035ba9920356f58325b1257/dblp}, booktitle = {ISCAS}, crossref = {conf/iscas/2012}, ee = {https://doi.org/10.1109/ISCAS.2012.6271677}, interhash = {fa4eca7b7c02f323e1def5320720196b}, intrahash = {13a60ab87035ba9920356f58325b1257}, isbn = {978-1-4673-0218-0}, keywords = {dblp}, pages = {2023-2026}, publisher = {IEEE}, timestamp = {2024-04-10T17:47:26.000+0200}, title = {A low cost method for testing offset and gain error for ADC BIST.}, url = {http://dblp.uni-trier.de/db/conf/iscas/iscas2012.html#DuanCG12}, year = 2012 }