%0 Journal Article %1 journals/tr/YanWGSW19 %A Yan, Aibin %A Wu, Zhen %A Guo, Jing %A Song, Jie %A Wen, Xiaoqing %D 2019 %J IEEE Trans. Reliability %K dblp %N 1 %P 354-363 %T Novel Double-Node-Upset-Tolerant Memory Cell Designs Through Radiation-Hardening-by-Design and Layout. %U http://dblp.uni-trier.de/db/journals/tr/tr68.html#YanWGSW19 %V 68

@article{journals/tr/YanWGSW19, added-at = {2019-04-12T00:00:00.000+0200}, author = {Yan, Aibin and Wu, Zhen and Guo, Jing and Song, Jie and Wen, Xiaoqing}, biburl = {https://www.bibsonomy.org/bibtex/2074e0cfc488f04bf05e82fd59bbf0fa1/dblp}, ee = {https://doi.org/10.1109/TR.2018.2876243}, interhash = {fb283937bd5a38b297adbf2bb8a82323}, intrahash = {074e0cfc488f04bf05e82fd59bbf0fa1}, journal = {IEEE Trans. Reliability}, keywords = {dblp}, number = 1, pages = {354-363}, timestamp = {2019-04-13T11:46:21.000+0200}, title = {Novel Double-Node-Upset-Tolerant Memory Cell Designs Through Radiation-Hardening-by-Design and Layout.}, url = {http://dblp.uni-trier.de/db/journals/tr/tr68.html#YanWGSW19}, volume = 68, year = 2019 }