%0 Conference Paper %1 conf/vts/MuradaliR96 %A Muradali, Fidel %A Rajski, Janusz %B VTS %D 1996 %I IEEE Computer Society %K dblp %P 17-25 %T A self-driven test structure for pseudorandom testing of non-scan sequential circuits. %U http://dblp.uni-trier.de/db/conf/vts/vts1996.html#MuradaliR96 %@ 0-8186-7304-4

@inproceedings{conf/vts/MuradaliR96, added-at = {2023-03-24T00:00:00.000+0100}, author = {Muradali, Fidel and Rajski, Janusz}, biburl = {https://www.bibsonomy.org/bibtex/25d14fefcd918a447eca0c30853a9883a/dblp}, booktitle = {VTS}, crossref = {conf/vts/1996}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTEST.1996.510830}, interhash = {fb2ac630bb255d8e14f76a7c74f93f8a}, intrahash = {5d14fefcd918a447eca0c30853a9883a}, isbn = {0-8186-7304-4}, keywords = {dblp}, pages = {17-25}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T07:35:16.000+0200}, title = {A self-driven test structure for pseudorandom testing of non-scan sequential circuits.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts1996.html#MuradaliR96}, year = 1996 }