%0 Journal Article %1 Downer2001 %A Downer, M. C. %A Mendoza, B. S. %A Gavrilenko, V. I. %D 2001 %J Surface and Interface Analysis %K imported %N 10 %P 966--986 %T Optical second harmonic spectroscopy of semiconductor surfaces: advances in microscopic understanding %U http://dx.doi.org/10.1002/sia.1133 %V 31 %X Even-order non-linear optical spectroscopy has emerged as an unusually sensitive technique for non-invasive analysis of surfaces and buried interfaces of centrosymmetric materials. The forefront challenges are: to develop reliable microscopic computational methods for calculating and interpreting measured surface non-linear spectra; to relate non-linear surface spectra quantitatively to linear optical surface probes such as reflectance-difference spectroscopy (RDS); and to develop convenient methods for acquiring non-linear optical spectra over bandwidths (several electron-volts) that encompass multiple electronic surface resonances. We review recent advances in both calculation and measurement of non-linear spectra, with emphasis on reconstructed and adsorbate-covered silicon surfaces in epitaxial growth environments. Copyright © 2001 John Wiley & Sons, Ltd.

@article{Downer2001, abstract = {Even-order non-linear optical spectroscopy has emerged as an unusually sensitive technique for non-invasive analysis of surfaces and buried interfaces of centrosymmetric materials. The forefront challenges are: to develop reliable microscopic computational methods for calculating and interpreting measured surface non-linear spectra; to relate non-linear surface spectra quantitatively to linear optical surface probes such as reflectance-difference spectroscopy (RDS); and to develop convenient methods for acquiring non-linear optical spectra over bandwidths (several electron-volts) that encompass multiple electronic surface resonances. We review recent advances in both calculation and measurement of non-linear spectra, with emphasis on reconstructed and adsorbate-covered silicon surfaces in epitaxial growth environments. Copyright © 2001 John Wiley & Sons, Ltd.}, added-at = {2010-01-22T11:58:32.000+0100}, author = {Downer, M. C. and Mendoza, B. S. and Gavrilenko, V. I.}, biburl = {https://www.bibsonomy.org/bibtex/2a2fbe0c9644e7b991aa969ed43432b0a/myrta}, description = {Second Harmonic generation in semiconductors; excitonic effects}, file = {:home/cfc/myrta/VirtualLibrary/MemoryKernel/DownerMG01.pdf:PDF}, interhash = {fd34cef0754b55136f42a39b8b3cac69}, intrahash = {a2fbe0c9644e7b991aa969ed43432b0a}, journal = {Surface and Interface Analysis}, keywords = {imported}, number = 10, owner = {myrta}, pages = {966--986}, timestamp = {2010-01-22T11:58:32.000+0100}, title = {Optical second harmonic spectroscopy of semiconductor surfaces: advances in microscopic understanding}, url = {http://dx.doi.org/10.1002/sia.1133}, volume = 31, year = 2001 }