%0 Journal Article %1 journals/mr/YenYWHYH12 %A Yen, H. D. %A Yuan, Jiann-Shiun %A Wang, Ruey-Lue %A Huang, G. W. %A Yeh, W. K. %A Huang, F. S. %D 2012 %J Microelectron. Reliab. %K dblp %N 11 %P 2655-2659 %T RF stress effects on CMOS LC-loaded VCO reliability evaluated by experiments. %U http://dblp.uni-trier.de/db/journals/mr/mr52.html#YenYWHYH12 %V 52

@article{journals/mr/YenYWHYH12, added-at = {2024-01-19T00:00:00.000+0100}, author = {Yen, H. D. and Yuan, Jiann-Shiun and Wang, Ruey-Lue and Huang, G. W. and Yeh, W. K. and Huang, F. S.}, biburl = {https://www.bibsonomy.org/bibtex/261f58883b29501a0204a2e3d01f56657/dblp}, ee = {https://doi.org/10.1016/j.microrel.2012.04.007}, interhash = {feaeb97e80637ee9ac8a9994095f288a}, intrahash = {61f58883b29501a0204a2e3d01f56657}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 11, pages = {2655-2659}, timestamp = {2024-04-09T02:49:20.000+0200}, title = {RF stress effects on CMOS LC-loaded VCO reliability evaluated by experiments.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#YenYWHYH12}, volume = 52, year = 2012 }