High temperature electrical resistivity and Seebeck coefficient of Ge \textlesssub\textgreater2\textless/sub\textgreater Sb \textlesssub\textgreater2\textless/sub\textgreater Te \textlesssub\textgreater5\textless/sub\textgreater thin films
High-temperature characterization of the thermoelectric properties of chalcogenide Ge2Sb2Te5 (GST) is critical for phase change memory devices, which utilize self-heating to quickly switch between amorphous and crystalline states and experience significant thermoelectric effects. In this work, the electrical resistivity and Seebeck coefficient are measured simultaneously as a function of temperature, from room temperature to 600 °C, on 50 nm and 200 nm GST thin films deposited on silicon dioxide. Multiple heating and cooling cycles with increasingly maximum temperature allow temperature-dependent characterization of the material at each crystalline state; this is in contrast to continuous measurements which return the combined effects of the temperature dependence and changes in the material. The results show p-type conduction (S \textgreater 0), linear S(T), and a positive Thomson coefficient (dS/dT) up to melting temperature. The results also reveal an interesting linearity between dS/dT and the conduction activat...
%0 Journal Article
%1 adnane2017temperature
%A Adnane, L.
%A Dirisaglik, F.
%A Cywar, A.
%A Cil, K.
%A Zhu, Y.
%A Lam, C.
%A Anwar, A. F. M.
%A Gokirmak, A.
%A Silva, H.
%D 2017
%I AIP Publishing LLC
%J Journal of Applied Physics
%K Seebeck change compounds,electrical compounds,grain diffraction,amorphous effect,Thomson effect,X-ray effects,percolation,phase expansion films,thermal growth,semiconductor materials,semiconductor resistivity,germanium semiconductors,antimony size,heat thin treatment,high-temperature
%N 12
%P 125104
%R 10.1063/1.4996218
%T High temperature electrical resistivity and Seebeck coefficient of Ge \textlesssub\textgreater2\textless/sub\textgreater Sb \textlesssub\textgreater2\textless/sub\textgreater Te \textlesssub\textgreater5\textless/sub\textgreater thin films
%U http://aip.scitation.org/doi/10.1063/1.4996218
%V 122
%X High-temperature characterization of the thermoelectric properties of chalcogenide Ge2Sb2Te5 (GST) is critical for phase change memory devices, which utilize self-heating to quickly switch between amorphous and crystalline states and experience significant thermoelectric effects. In this work, the electrical resistivity and Seebeck coefficient are measured simultaneously as a function of temperature, from room temperature to 600 °C, on 50 nm and 200 nm GST thin films deposited on silicon dioxide. Multiple heating and cooling cycles with increasingly maximum temperature allow temperature-dependent characterization of the material at each crystalline state; this is in contrast to continuous measurements which return the combined effects of the temperature dependence and changes in the material. The results show p-type conduction (S \textgreater 0), linear S(T), and a positive Thomson coefficient (dS/dT) up to melting temperature. The results also reveal an interesting linearity between dS/dT and the conduction activat...
@article{adnane2017temperature,
abstract = {High-temperature characterization of the thermoelectric properties of chalcogenide Ge2Sb2Te5 (GST) is critical for phase change memory devices, which utilize self-heating to quickly switch between amorphous and crystalline states and experience significant thermoelectric effects. In this work, the electrical resistivity and Seebeck coefficient are measured simultaneously as a function of temperature, from room temperature to 600 °C, on 50 nm and 200 nm GST thin films deposited on silicon dioxide. Multiple heating and cooling cycles with increasingly maximum temperature allow temperature-dependent characterization of the material at each crystalline state; this is in contrast to continuous measurements which return the combined effects of the temperature dependence and changes in the material. The results show p-type conduction (S {\textgreater} 0), linear S(T), and a positive Thomson coefficient (dS/dT) up to melting temperature. The results also reveal an interesting linearity between dS/dT and the conduction activat...},
added-at = {2019-01-03T22:40:30.000+0100},
author = {Adnane, L. and Dirisaglik, F. and Cywar, A. and Cil, K. and Zhu, Y. and Lam, C. and Anwar, A. F. M. and Gokirmak, A. and Silva, H.},
biburl = {https://www.bibsonomy.org/bibtex/200d5e08837cb354c1ce0cfaa114a70b6/jjs027},
doi = {10.1063/1.4996218},
file = {:H$\backslash$:/Jake/Mendeley/2017{\_}Adnane{\_}HighTemperatureElectricalResistivityAndSeebeckCoefficientOfGe2Sb2Te5ThinFilms.pdf:pdf},
interhash = {acad50e02aaab330fd002694dad6ba53},
intrahash = {00d5e08837cb354c1ce0cfaa114a70b6},
issn = {0021-8979},
journal = {Journal of Applied Physics},
keywords = {Seebeck change compounds,electrical compounds,grain diffraction,amorphous effect,Thomson effect,X-ray effects,percolation,phase expansion films,thermal growth,semiconductor materials,semiconductor resistivity,germanium semiconductors,antimony size,heat thin treatment,high-temperature},
month = sep,
number = 12,
pages = 125104,
publisher = {AIP Publishing LLC},
timestamp = {2019-01-03T22:45:29.000+0100},
title = {{High temperature electrical resistivity and Seebeck coefficient of Ge {\textless}sub{\textgreater}2{\textless}/sub{\textgreater} Sb {\textless}sub{\textgreater}2{\textless}/sub{\textgreater} Te {\textless}sub{\textgreater}5{\textless}/sub{\textgreater} thin films}},
url = {http://aip.scitation.org/doi/10.1063/1.4996218},
volume = 122,
year = 2017
}