%0 Journal Article %1 WISE2001 %A Wise, L. J. %A Schrimpf, R. D. %A Parks, H.G. %A Galloway, K.F. %D 2001 %J Microelectronics Reliability %K imported %P pp. 317-322 %T A generalized model for the lifetime of microelectronic components, applied to storage conditions %V 41

@article{WISE2001, added-at = {2013-01-07T16:10:56.000+0100}, author = {Wise, L. J. and Schrimpf, R. D. and Parks, H.G. and Galloway, K.F.}, biburl = {https://www.bibsonomy.org/bibtex/2055491e4a4993cdfca484df36b5eed02/olivia.bluder}, file = {:P\:\\KAI_AP2\\People\\Plankensteiner\\DISS\\Literature_lifetimeModels\\time-dependentModel2001.pdf:PDF}, interhash = {31736164f14e95c5bcce593ce6dfd9b8}, intrahash = {055491e4a4993cdfca484df36b5eed02}, journal = {Microelectronics Reliability}, keywords = {imported}, owner = {plankensteiner}, pages = {pp. 317-322}, timestamp = {2013-01-07T16:10:59.000+0100}, title = {A generalized model for the lifetime of microelectronic components, applied to storage conditions}, volume = 41, year = 2001 }