%0 Journal Article %1 journals/tr/BarnettSN03 %A Barnett, Thomas S. %A Singh, Adit D. %A Nelson, Victor P. %D 2003 %J IEEE Trans. Reliability %K dblp %N 3 %P 296-300 %T Extending integrated-circuit yield-models to estimate early-life reliability. %U http://dblp.uni-trier.de/db/journals/tr/tr52.html#BarnettSN03 %V 52

@article{journals/tr/BarnettSN03, added-at = {2016-03-09T00:00:00.000+0100}, author = {Barnett, Thomas S. and Singh, Adit D. and Nelson, Victor P.}, biburl = {https://www.bibsonomy.org/bibtex/20f07778a13426a0546ee08be23e75869/dblp}, ee = {http://dx.doi.org/10.1109/TR.2003.816418}, interhash = {0402605e517b57b5f2e9cec0c36d0787}, intrahash = {0f07778a13426a0546ee08be23e75869}, journal = {IEEE Trans. Reliability}, keywords = {dblp}, number = 3, pages = {296-300}, timestamp = {2016-03-10T17:37:49.000+0100}, title = {Extending integrated-circuit yield-models to estimate early-life reliability.}, url = {http://dblp.uni-trier.de/db/journals/tr/tr52.html#BarnettSN03}, volume = 52, year = 2003 }