%0 Journal Article %1 journals/jolpe/BadrudduzaAJGRC18 %A Badrudduza, S. %A Abeln, G. %A Jew, T. %A Grudowski, P. %A Roy, A. %A Cavins, C. %D 2018 %J J. Low Power Electron. %K dblp %N 3 %P 393-403 %T Automotive Reliable Memories Integrated into an Ultra-Low Power 40 nm CMOS Logic Process. %U http://dblp.uni-trier.de/db/journals/jolpe/jolpe14.html#BadrudduzaAJGRC18 %V 14

@article{journals/jolpe/BadrudduzaAJGRC18, added-at = {2020-05-22T00:00:00.000+0200}, author = {Badrudduza, S. and Abeln, G. and Jew, T. and Grudowski, P. and Roy, A. and Cavins, C.}, biburl = {https://www.bibsonomy.org/bibtex/20fa6656987b62dc3dbb581f5720fe512/dblp}, ee = {https://doi.org/10.1166/jolpe.2018.1570}, interhash = {bea4e9b36ea33f6153b0f1889a6f91c7}, intrahash = {0fa6656987b62dc3dbb581f5720fe512}, journal = {J. Low Power Electron.}, keywords = {dblp}, number = 3, pages = {393-403}, timestamp = {2020-05-23T12:25:32.000+0200}, title = {Automotive Reliable Memories Integrated into an Ultra-Low Power 40 nm CMOS Logic Process.}, url = {http://dblp.uni-trier.de/db/journals/jolpe/jolpe14.html#BadrudduzaAJGRC18}, volume = 14, year = 2018 }