X-ray multiple diffraction as a probe to determine all the pieioelectric
coefficients of a crystal: Rochelle salt case
JOURNAL OF PHYSICS-CONDENSED MATTER, 15 (46):
7835-7842 (2003)DOI: 10.1088/0953-8984/15/46/002
Abstract
The x-ray multiple diffraction method, which allows us to determine the
piezoelectric coefficients of a single crystal under an external
electric field (E), was applied to Rochelle salt (dos Santos et al 2001
J. Phys.: Condens. Matter 13 10497) for E parallel to the piezoelectric
Y direction. In this work, the theory was extended to consider an
observed monoclinic-triclinic distortion under E application into the
other two piezoelectric X and Z directions. Renninger scans carried out
using the chosen (060) primary reflection have provided the four
remaining coefficients through the measurement of the properly chosen
Secondary peaks. so that all eight piezoelectric coefficients (d(14),
d(16), d(21), d(22), d(23), d(2), d(34) and d(36)) for Rochelle salt
were determined.