The combination of synchrotron radiation x-ray imaging and diffraction techniques offers new possibilities for in-situ observation of deformation and damage mechanisms in the bulk of polycrystalline materials. Minute changes in electron density (i.e., cracks, porosities) can be detected using propagation based phase contrast imaging, a 3-D imaging mode exploiting the coherence properties of third generation synchrotron beams. Furthermore, for some classes of polycrystalline materials, one may use a 3-D variant of x-ray diffraction imaging, termed x-ray diffraction contrast tomography. X-ray diffraction contrast tomography provides access to the 3-D shape, orientation, and elastic strain state of the individual grains from polycrystalline sample volumes containing up to thousand grains. Combining both imaging modalities, one obtains a comprehensive description of the materials microstructure at the micrometer length scale. Repeated observation during (interrupted) mechanical tests provide unprecedented insight into crystallographic and grain microstructure related aspects of polycrystalline deformation and degradation mechanisms.
Описание
SpringerLink - JOM Journal of the Minerals, Metals and Materials Society, Volume 62, Number 12
%0 Journal Article
%1 springerlink:10.1007/s11837-010-0176-6
%A Ludwig, W.
%A King, A.
%A Herbig, M.
%A Reischig, P.
%A Marrow, J.
%A Babout, L.
%A Lauridsen, E.
%A Proudhon, H.
%A Buffière, J.
%D 2010
%I Springer Boston
%J JOM Journal of the Minerals, Metals and Materials Society
%K diffraction imaging myown polycrystalline x-ray
%N 12
%P 22--28
%R 10.1007/s11837-010-0176-6
%T Characterization of polycrystalline materials using synchrotron X-ray imaging and diffraction techniques
%U http://dx.doi.org/10.1007/s11837-010-0176-6
%V 62
%X The combination of synchrotron radiation x-ray imaging and diffraction techniques offers new possibilities for in-situ observation of deformation and damage mechanisms in the bulk of polycrystalline materials. Minute changes in electron density (i.e., cracks, porosities) can be detected using propagation based phase contrast imaging, a 3-D imaging mode exploiting the coherence properties of third generation synchrotron beams. Furthermore, for some classes of polycrystalline materials, one may use a 3-D variant of x-ray diffraction imaging, termed x-ray diffraction contrast tomography. X-ray diffraction contrast tomography provides access to the 3-D shape, orientation, and elastic strain state of the individual grains from polycrystalline sample volumes containing up to thousand grains. Combining both imaging modalities, one obtains a comprehensive description of the materials microstructure at the micrometer length scale. Repeated observation during (interrupted) mechanical tests provide unprecedented insight into crystallographic and grain microstructure related aspects of polycrystalline deformation and degradation mechanisms.
@article{springerlink:10.1007/s11837-010-0176-6,
abstract = {The combination of synchrotron radiation x-ray imaging and diffraction techniques offers new possibilities for in-situ observation of deformation and damage mechanisms in the bulk of polycrystalline materials. Minute changes in electron density (i.e., cracks, porosities) can be detected using propagation based phase contrast imaging, a 3-D imaging mode exploiting the coherence properties of third generation synchrotron beams. Furthermore, for some classes of polycrystalline materials, one may use a 3-D variant of x-ray diffraction imaging, termed x-ray diffraction contrast tomography. X-ray diffraction contrast tomography provides access to the 3-D shape, orientation, and elastic strain state of the individual grains from polycrystalline sample volumes containing up to thousand grains. Combining both imaging modalities, one obtains a comprehensive description of the materials microstructure at the micrometer length scale. Repeated observation during (interrupted) mechanical tests provide unprecedented insight into crystallographic and grain microstructure related aspects of polycrystalline deformation and degradation mechanisms.},
added-at = {2011-02-18T19:51:20.000+0100},
affiliation = {Université de Lyon, INSA-Lyon, MATEIS CNRS UMR 5510, 69621 Villeurbanne, France},
author = {Ludwig, W. and King, A. and Herbig, M. and Reischig, P. and Marrow, J. and Babout, L. and Lauridsen, E. and Proudhon, H. and Buffière, J.},
biburl = {https://www.bibsonomy.org/bibtex/215809da6dbad23686745dba4952f70f7/heprom},
description = {SpringerLink - JOM Journal of the Minerals, Metals and Materials Society, Volume 62, Number 12},
doi = {10.1007/s11837-010-0176-6},
interhash = {ad52985430464c72d620c588b930f8f9},
intrahash = {15809da6dbad23686745dba4952f70f7},
issn = {1047-4838},
issue = {12},
journal = {JOM Journal of the Minerals, Metals and Materials Society},
keyword = {Chemistry and Materials Science},
keywords = {diffraction imaging myown polycrystalline x-ray},
number = 12,
pages = {22--28},
publisher = {Springer Boston},
timestamp = {2011-02-18T19:51:20.000+0100},
title = {Characterization of polycrystalline materials using synchrotron X-ray imaging and diffraction techniques},
url = {http://dx.doi.org/10.1007/s11837-010-0176-6},
volume = 62,
year = 2010
}