%0 Conference Paper %1 conf/dac/GuoRP99 %A Guo, Ruifeng %A Reddy, Sudhakar M. %A Pomeranz, Irith %B DAC %D 1999 %E Irwin, Mary Jane %I ACM Press %K dblp %P 653-659 %T Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction. %U http://dblp.uni-trier.de/db/conf/dac/dac99.html#GuoRP99

@inproceedings{conf/dac/GuoRP99, added-at = {2017-03-16T00:00:00.000+0100}, author = {Guo, Ruifeng and Reddy, Sudhakar M. and Pomeranz, Irith}, biburl = {https://www.bibsonomy.org/bibtex/21ad94c6b3680f1752e3960ee0007502b/dblp}, booktitle = {DAC}, crossref = {conf/dac/1999}, editor = {Irwin, Mary Jane}, ee = {http://doi.acm.org/10.1145/309847.310019}, interhash = {83ffa075dad00992ee74d579081a9234}, intrahash = {1ad94c6b3680f1752e3960ee0007502b}, keywords = {dblp}, pages = {653-659}, publisher = {ACM Press}, timestamp = {2017-03-17T11:40:28.000+0100}, title = {Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac99.html#GuoRP99}, year = 1999 }