%0 Journal Article %1 journals/tcad/PomeranzR06 %A Pomeranz, Irith %A Reddy, Sudhakar M. %D 2006 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 3 %P 591-596 %T Scan-BIST based on transition probabilities for circuits with single and multiple scan chains. %U http://dblp.uni-trier.de/db/journals/tcad/tcad25.html#PomeranzR06 %V 25

@article{journals/tcad/PomeranzR06, added-at = {2020-09-24T00:00:00.000+0200}, author = {Pomeranz, Irith and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/2273cd4740f107c44c7751e4bc65d3a0f/dblp}, ee = {https://doi.org/10.1109/TCAD.2005.854634}, interhash = {a3e027230e81d20ddc42ee6e13296fe4}, intrahash = {273cd4740f107c44c7751e4bc65d3a0f}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 3, pages = {591-596}, timestamp = {2020-09-25T11:49:34.000+0200}, title = {Scan-BIST based on transition probabilities for circuits with single and multiple scan chains.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad25.html#PomeranzR06}, volume = 25, year = 2006 }