%0 Conference Paper %1 conf/ets/DehbashiFRR12 %A Dehbashi, Mehdi %A Fey, Görschwin %A Roy, Kaushik %A Raghunathan, Anand %B European Test Symposium %D 2012 %I IEEE Computer Society %K %P 1 %T Functional analysis of circuits under timing variations. %U http://dblp.uni-trier.de/db/conf/ets/ets2012.html#DehbashiFRR12 %@ 978-1-4673-0697-3

@inproceedings{conf/ets/DehbashiFRR12, added-at = {2023-12-12T19:42:52.000+0100}, author = {Dehbashi, Mehdi and Fey, Görschwin and Roy, Kaushik and Raghunathan, Anand}, biburl = {https://www.bibsonomy.org/bibtex/291d4c429208680edda4e4b0f8f11e419/admin}, booktitle = {European Test Symposium}, crossref = {conf/ets/2012}, ee = {https://doi.org/10.1109/ETS.2012.6233031}, interhash = {24ed85809c368ba123cec18b957eb674}, intrahash = {91d4c429208680edda4e4b0f8f11e419}, isbn = {978-1-4673-0697-3}, keywords = {}, pages = 1, publisher = {IEEE Computer Society}, timestamp = {2023-12-12T19:42:52.000+0100}, title = {Functional analysis of circuits under timing variations.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2012.html#DehbashiFRR12}, year = 2012 }